The Agilent 44473A module brings highly flexible matrix switching to your test system. You can use the matrix switch module to conveniently connect a group of instruments to several points on the DUT. Individual modules provide a 4×4 two-wire matrix that allows any combination of inputs and outputs to be connected for signals up to 250V or 2A.
Agilent 44473A 4×4 Two-Wire Matrix Switch Module With Block
Use the Agilent 34908A module for the 34970A Data Acquisition/Switch Unit for the greatest density in common-low applications, such as battery test, component characterization, and benchtop testing. Each module switches 40 one-wire inputs. All two-wire internal measurements except current are supported. The module low connection is isolated from earth and can float up to 300 V.
The Agilent 34902A module for the 34970A Data Acquisition/Switch Unit employs reed relays to achieve scan rates up to 250 channels-per-second. Use this module for high-throughput automated test applications as well as high-speed data logging and monitoring tasks. Sixteen two-wire inputs switch up to 300 V. Two-and four-wire channels may be mixed on the same module. User provided shunt resistors are required for current measurements
The Agilent 16712A, 100 MHz state and 500 MHz timing analysis module, offers industry standard state and timing analysis features at an affordable price. With this module, there is no need to connect special probes to view timing activity. All channels perform either state or timing functions. Set up your analyzer to perform simultaneous, fully time-correlated state analysis on some channels and timing analysis on the rest.
The Tektronix 80E04 is a dual-channel Time Domain Reflectometry (TDR) sampling module. This sampling module provides an acquisition rise time of 17.5 ps or less, with a typical 20 GHz equivalent bandwidth. Each channel of the Tektronix 80E04 is capable of generating a fast step for use in TDR mode and the acquisition portion of the sampling module monitors the incident step and any reflected energy. The reflected rise time of the TDR step is 35 ps or less and the polarity of each channel’s step can be selected independently. This allows for differential or common-mode testing of two coupled lines, in addition to the independent testing of isolated lines. The Tektronix 80E04 characterizes crosstalk by using the TDR step to drive one line while monitoring a second line with the other channel. The “filter” function on the CSA8000/TDS8000 can be used with TDR or crosstalk measurements to characterize expected system performance with slower edge rates.
The 80E02 is a dual-channel, 12.5 GHz sampling module specifically designed for low-noise measurements in digital communications and device characterization applications. It provides an acquisition rise time of 28 ps and typically 400 µV RMS of displayed noise.
The 80E02 is the ideal instrument for low-noise applications. Common applications for the 80E02 are capturing and displaying switching characteristics of high-speed communications circuits, making accurate statistical measurements of signal noise and signal timing jitter, or obtaining stable timing measurements of fast digital ICs.
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