HP/Agilent E5501B Phase Noise Measurement Solution, 50 kHz to 1.6 GHz


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The E5501B phase noise measurement solution simplifies ATE test times for one-port VOC’s, DROs, crystal oscillators and synthesizers and maximizes capability for R& D benchtop applications. The Agilent E5501B phase noise measurement solution has been designed to simplify phase noise measurements of one-port VCOs, DROs, crystal oscillators, and synthesizers and to maximize the capability for R&D benchtop applications. In addition, with a standard offset range capability from 0.01 Hz to 100 MHz, the Agilent E5501B provides the capability, flexibility and versatility to meet changing and demanding needs placed upon the R&D engineer. By building upon 30 years of Agilent Technologies low phase noise, RF design and measurement experience, the Agilent E5501B solution continues to provide excellent measurement integrity, repeatability and accuracy.

SKU: KEYE5501B Categories: , Tag:

Description

50 kHz to 1.6 GHz
Ability to test a wide range of devices
Measure AM noise directly
Measure offsets to 100 MHz
Industry leading sensitivity

Additional information

Weight 42 lbs