Simultaneous measurements on multiple channels
Simplifies test of parallel optic devices
Parallel eye diagram analysis
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HP/Agilent 86111U Dual Optical 15 GHz Plug-in Module. Simultaneous measurements on multiple channels improves throughput by eliminating the need to sequentially measure individual channels of a parallel optic component, but rather allowing multiple channels to be measured at the same time. For network equipment manufacturers, throughput is improved by allowing multiple devices, or multiple ports on a single device to be tested at the same time.