HP/Agilent 8517B Test Set S-Parameter, 0.045 to 50 GHz, 2.4 mm


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The Agilent 8517B test set has an architecture that develops a separate reference channel for each incident port. RF switching is done with a built-in electronic switch. For active device measurements, the test sets include the ability to apply dc bias (external) to the test port center conductors. Also available are two 60 dB step attenuators, which allow control of the port 1 and port 2 signal levels.

Description

The Agilent 8517B test set has an architecture that develops a separate reference channel for each incident port. RF switching is done with a built-in electronic switch. For active device measurements, the test sets include the ability to apply dc bias (external) to the test port center conductors. Also available are two 60 dB step attenuators, which allow control of the port 1 and port 2 signal levels.

Additional information

Weight 35 lbs
Dimensions 6 × 19 × 20 in

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