The GTL 4040 is a popular and versatile probe station. It has a convenient and flexible size, many options to allow configuration for custom applications, and the same precise tolerances and accurate positioning mechanism to handle a range of applications. The 4040 can support either a rigid bridge microscope positioner, or a flex-arm microscope holder. The bridge is usually preferred for it’s flexibility and stability for probing “planar” structures, while the free-motion arm allows viewing and probing of “vertically-mounted” samples like daughtercards or linecards. The probe station can easily accommodate 4 GTL micropositioners for measuring differential pairs with either a TDR scope or VNA, and has an optional vacuum-mounted wafer chuck for probing wafer-level devices and components.