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The Agilent E5504B phase noise measurement solution simplifies ATE test times for one-port VOC’s, DROs, crystal oscillators and synthesizers and maximizes capability for R& D benchtop applications. The Agilent E5504B phase noise measurement solution has been designed to simplify phase noise measurements of one-port VCOs, DROs, crystal oscillators, and synthesizers and to maximize the capability for R&D benchtop applications. In addition, with a standard offset range capability from 0.01 Hz to 100 MHz, the Agilent E5504B provides the capability, flexibility and versatility to meet changing and demanding needs placed upon the R&D engineer. By building upon 30 years of Agilent Technologies low phase noise, RF design and measurement experience, the Agilent E5504B solution continues to provide excellent measurement integrity, repeatability and accuracy.
50 kHz to 26.5 GHz
with expanded carrier frequencies to 110 GHz
Ability to test a wide range of devices
Measure AM noise directly
Measure offsets to 100 MHz
Industry leading sensitivity
Stepped upgrade path from Agilent 3048 Systems
| Weight | 81 lbs |
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