Description
Highest Fidelity Signal Capture
Very Low Time-base Jitter
425ย fs Typical on up to 8 Simultaneously Acquired Channels
<100ย fs Typical on up to 6ย Channels with 82A04B Phase Reference Module
Industryโs Highest Vertical Resolution โ 16ย bit A/D
Electrical Resolution: <20ย ยตV LSB (for 1ย V full range)
Optical Resolution depends on the Dynamic Range of the Optical Module โ Ranges from <20ย nW for the 80C07B (1ย mW full range) to <0.6ย ยตW for the 80C10C (30ย mW full range)
Flexible Configurations
With Todayโs Sampling Module Portfolio, the DSA8300 supports up to 8 Simultaneously Acquired Signals
A Wide Variety of Optical, Electrical, and Accessory Modules to support your Specific Testing Requirements
Optical Modules
Fully Integrated Optical Modules that support all Standard Optical Data Rates from 155ย Mb/s to 100ย Gb/s
Certified Optical Reference Receivers Support Specified Requirements for Standards-mandated Compliance Testing
Optical Bandwidths to >80ย GHz
High Optical Sensitivity, Low Noise, and Wide Dynamic Range of the Optical Sampling Modules allows Accurate Testing and Characterization of Short-reach to Long-haul Optical Communications Standards
Fully Calibrated Clock Recovery Solutions โ No need to manually calibrate for data pick-off losses
Calibrated Extinction Ratio Measurements ensure Repeatability of Extinction Ratio Measurements to <0.5ย dB among Systems with Modules with this Factory Calibration Option
Electrical Modules
Electrical Bandwidths to >70ย GHz
Very Low-noise Electrical Samplers (280ย ยตV at 20ย GHz, 450ย ยตV at 60ย GHz, typical)
Selectable Bandwidths* allow the User to Trade-off Sampler Bandwidth and Noise for Optimal Data Acquisition Performance
Remote Samplers* or Compact Sampling Extender Module Cables support Minimal Signal Degradation by allowing the Sampler to be Located in Close Proximity to the Device Under Test
Worldโs Highest-performance Integrated TDR (10ย ps typical step rise time) supports Exceptional Impedance Discontinuity Characterization and High Dynamic Range for S-parameter Measurements to 50ย GHz