Description
Data Rate to 1.1 Gb/s Tests High-speed Logic Devices and Circuits
Data Pattern Depth to 256 K/channel Speeds Characterization
2 Output Channels Increases Flexibility
Control of Edge Timing Permits Jitter Simulation in Serial Data Streams
Precise Control of Output Parameters Include:
Variable Output Delay
Variable Output Level
Fast Transition Times to 150 ps Aids Fast Logic Evaluation
Complementary Output Assures Excellent Signal Fidelity
Flexible Sequence Control with Jump, Event and Nested Loops
Large Display for Easy-to-Use Data Editing
Import Pattern Data with DG-link Software Utility
Integrate into ATE Systems via GPIB/RS-232-C Interface
