Description
50 kHz to 1.6 GHz
Ability to test a wide range of devices
Measure AM noise directly
Measure offsets to 100 MHz
Industry leading sensitivity
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The E5501B phase noise measurement solution simplifies ATE test times for one-port VOC’s, DROs, crystal oscillators and synthesizers and maximizes capability for R& D benchtop applications. The Agilent E5501B phase noise measurement solution has been designed to simplify phase noise measurements of one-port VCOs, DROs, crystal oscillators, and synthesizers and to maximize the capability for R&D benchtop applications. In addition, with a standard offset range capability from 0.01 Hz to 100 MHz, the Agilent E5501B provides the capability, flexibility and versatility to meet changing and demanding needs placed upon the R&D engineer. By building upon 30 years of Agilent Technologies low phase noise, RF design and measurement experience, the Agilent E5501B solution continues to provide excellent measurement integrity, repeatability and accuracy.
50 kHz to 1.6 GHz
Ability to test a wide range of devices
Measure AM noise directly
Measure offsets to 100 MHz
Industry leading sensitivity
Weight | 42 lbs |
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