Description
Integrated synthesized source and transmission/reflection test set enable the complete swept frequency characterization of RF components with a single connection. The internal synthesized source is a fast (50 ms/sweep) and stable (1 Hz resolution) stimulus for testing narrowband and broadband detection, which makes the instrument ideal for testing linear and non-linear components that make up RF systems. Broadband detection allows characterization of frequency translation devices, while narrowband detection provides greater than 90 dB of dynamic range for testing high rejection, narrowband devices.
