The Agilent 1152A active probe’s bandwidth, superior accuracy, and reliability make it an ideal companion for the Agilent 54845A 1.5 GHz bandwidth oscilloscope. The low input capacitance of the active probe eliminates distortion caused by excessive loading. As frequency increases, probe tip capacitance decreases the impedance of the probe by Xc=1/(2pi*fC), resulting in measurement error, depending on the source impedance of the output device. The Agilent 1152A’s low tip capacitance becomes a distinct advantage as frequency increases. Nonintrusive, reliable probing provides faithful reproduction of signals.
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The Agilent 1144A active probe provides an excellent combination of high bandwidth, high input resistance, and low input capacitance. This combination is superior to that of passive divider probes because it provides minimal circuit loading at high and low frequencies. As signal speeds increase, passive divider probes may not deliver the performance needed. This can result in waveshapes that do not represent the actual signal. To help you minimize circuit loading, the Agilent 1144A boasts a 800 MHz bandwidth, 1 M Ohm input resistance, and 2 pF input capacitance. It can be connected to any instrument with 50 Ohm inputs. An external 50 Ohm termination can also be used with high impedance inputs. For use with 6000 Series 300 MHz – 1 GHz, 54641A/D and 54642A/D oscilloscopes the Agilent 01144-61604 adapter can be used with this power supply to provide power for two channels of active probing. Versatile accessories allow for easy connection to your device under test. For example, the dual lead adapter combines with the two mini-pincher tips to provide a solid connection to 0.050 inch pitch surface mount devices for hands-off probing. Also, the ground bayonet has a short ground lead to minimize measurement errors such as ringing, caused by parasitic inductances. For hands-off probing of SMT components with 0.5 mm (0.020 inch) to 0.8 mm (0.032 inch) pitch, an additional accessory is available: the Agilent 10075A 0.5 mm IC Clips Accessory Kit.
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The Agilent 1142A Probe Control and Power Module can power and control the 1141A Differential Probe, 1144A 800 MHz Active Probe and the 1145A 750 MHz Active Probe for SMD If the instrument does not have an internal 50-ohm termination, an external termination can be used with high-impedance inputs.
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The Agilent 1141A is a 1X FET differential probe with 200 MHz bandwidth and 3000:1 CMRR (Common Mode Rejection Ratio) at 1 MHz. The probe has an input resistance of 1 MO and low input capacitance of 7 pF, to minimize circuit loading. The Agilent 1141A 200 MHz Differential Probe must be used with the Agilent 1142A Probe Control and Power Module. It can be connected to any instrument with 50 ohm inputs. An external 50 ohm termination can also be used with high impedance inputs.
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The InfiniiMax 7 GHz 1134A probe amplifier (in conjunction with the E2669A differential or E2668A single-ended connectivity kits), was designed to be used with the Infiniium 6 GHz 54855A oscilloscope. This combination provides a full system bandwidth of 6 GHz to the probe tip. InfiniiMax maximizes measurement performance for both hands-on (e.g., browsing) or hands-off measurements, such as solder-in, socketed or SMA connections.
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The InfiniiMax 5 GHz 1132A probe amplifier (in conjunction with the E2669A differential or E2668A single-ended connectivity kits), was designed to be used with the Infiniium oscilloscopes. This combination provides a full system bandwidth of 4 GHz to the probe tip. InfiniiMax maximizes measurement performance for both hands-on (e.g., browsing) or hands-off measurements, such as solder-in, socketed or SMA connections.
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The Agilent 10076A 4 kV 100:1 passive probe gives you the voltage and bandwidth you need for making high-voltage measurements. Its compact design makes it easier to probe today’s small power electronics components and its rugged construction means it can withstand rough handling without breaking.
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The Tektronix 80E04 is a dual-channel Time Domain Reflectometry (TDR) sampling module. This sampling module provides an acquisition rise time of 17.5 ps or less, with a typical 20 GHz equivalent bandwidth. Each channel of the Tektronix 80E04 is capable of generating a fast step for use in TDR mode and the acquisition portion of the sampling module monitors the incident step and any reflected energy. The reflected rise time of the TDR step is 35 ps or less and the polarity of each channel’s step can be selected independently. This allows for differential or common-mode testing of two coupled lines, in addition to the independent testing of isolated lines. The Tektronix 80E04 characterizes crosstalk by using the TDR step to drive one line while monitoring a second line with the other channel. The “filter” function on the CSA8000/TDS8000 can be used with TDR or crosstalk measurements to characterize expected system performance with slower edge rates.
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The 80E02 is a dual-channel, 12.5 GHz sampling module specifically designed for low-noise measurements in digital communications and device characterization applications. It provides an acquisition rise time of 28 ps and typically 400 µV RMS of displayed noise.
The 80E02 is the ideal instrument for low-noise applications. Common applications for the 80E02 are capturing and displaying switching characteristics of high-speed communications circuits, making accurate statistical measurements of signal noise and signal timing jitter, or obtaining stable timing measurements of fast digital ICs.
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