HP/Agilent E5270A Parametric Measurement Mainframe, 8-slot


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The HP/Agilent E5270A, is an eight-slot user-configurable parametric measurement mainframe, which houses up to four HPSMUs or eight MPSMUs, creating a one-to-eight-channel test solution. The E5270A is ideal for testing RF devices, particularly monolithic microwave integrated circuits (MMICs), which require multiple DC bias sources on their non-RF pins during test. The E5270A can be configured with up to eight DC bias sources, reducing the overall number of touchdowns necessary to test MMIC wafers. The E5270A is also ideal for semiconductor characterization, where four or more SMUs are needed, or in situations where more than one HPSMU is required.

Description

The Agilent E5270A, is an eight-slot user-configurable parametric measurement mainframe, which houses up to four HPSMUs or eight MPSMUs, creating a one-to-eight-channel test solution. The E5270A is ideal for testing RF devices, particularly monolithic microwave integrated circuits (MMICs), which require multiple DC bias sources on their non-RF pins during test. The E5270A can be configured with up to eight DC bias sources, reducing the overall number of touchdowns necessary to test MMIC wafers. The E5270A is also ideal for semiconductor characterization, where four or more SMUs are needed, or in situations where more than one HPSMU is required.

Additional information

Weight 81 lbs